Hioki

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Created on: 17 May 2014

Data Creation System Delivers 90% Faster Data Generation, 93% Lower Line Stoppage Times The UA1780 enables high-quality test programs in a short period of time by using net information that has been reverse-generated from Gerber data and component information libraries, and delivers maximum performance when used in conjunction with Hioki’s new FA1240-50 flying probe tester.

Created on: 17 May 2014

High Performance Populated Board Testing with Expansion Capabilities In populated board production settings where improving productivity is key, even small time losses are unacceptable. The 1220 series provide a single solution for jobs that previously required multiple measuring instruments, featuring a compact PCI bus that delivers a dramatic speed boost of 150%.

Created on: 17 May 2014

Detection of IC lead pseudo-contact (poor contact) states • High-speed testing at up to 0.025 sec./step (1240-01, 1240-03) • Detection of IC lead float and pseudo-contact states • Support for active testing (optional feature) • High-precision probing • Large testing area of 510 × 460 mm (1240-01, 1240-02) • Standard transport capability • Automatic alignment function and simple visual test function